Probing Adhesion Forces at the Molecular Scale

Journal of the American Chemical Society

Volumn 117, Issue 13, 1995, Pages 3830-3834

  Thomas, Ross C ^a   Houston, J E ^a   Crooks, Richard M ^b   Kim, Taisun ^b   Michalske, Terry A ^a  

^a SANDIA NATIONAL LABORATORIES   (United States)

^b TEXAS A AND M UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ADHESION; FORCE MEASUREMENT; GOLD; HYDROGEN BONDS; INTERFACES (MATERIALS); MATHEMATICAL MODELS; MECHANICAL PROPERTIES; ORGANOMETALLICS; THIN FILMS;

ADHESION FORCES; ADHESIVE PULL OFF FORCE; INTERFACIAL BOND ENERGY; INTERFACIAL FORCE MICROSCOPY; METHYL GROUPS;

MONOLAYERS;

EID: 0029636414     PISSN: 00027863     EISSN: 15205126     Source Type: Journal    
DOI: 10.1021/ja00118a019     Document Type: Article

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