V-2: Effects of stress/strain

Cryogenics

Volumn 35, Issue SUPPL. 1, 1995, Pages

  Katagiri, K ^a   Okada, T ^b   Walters, C R ^c   Ekin, J W ^d  

^a IWATE UNIVERSITY   (Japan)

^b OSAKA UNIVERSITY   (Japan)

^c RUTHERFORD APPLETON LABORATORY   (United Kingdom)

^d NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CRITICAL CURRENTS; ELECTRIC CURRENT MEASUREMENT; SENSITIVITY ANALYSIS; STRAIN; STRAIN MEASUREMENT; STRESSES; SUPERCONDUCTING MATERIALS;

CRITICAL CURRENT MEASUREMENT; STRAIN DEPENDENCE; STRAIN SENSITIVITY; STRESS DEPENDENCE;

CRYOGENICS;

EID: 0029547295     PISSN: 00112275     EISSN: None     Source Type: Journal    
DOI: 10.1016/0011-2275(95)99832-S     Document Type: Article

References (5)

1. Strain scaling law for flux pinning in practical superconductors. Part 1: Basic relationship and application to Nb3Sn conductors