Low voltage silicon field emitters with gold gates

Proceedings of the IEEE International Vacuum Microelectronics Conference, IVMC

Volumn , Issue , 1995, Pages 42-46

  Trujillo, Johann T ^a   Chakhovskoi, Andrei ^a   Hunt, Charles E ^a  

^a UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CURRENT VOLTAGE CHARACTERISTICS; ELECTRIC CURRENT MEASUREMENT; ELECTRON DEVICES; ELECTRONIC EQUIPMENT MANUFACTURE; ELECTRONIC EQUIPMENT TESTING; ELECTRONICS PACKAGING; REACTIVE ION ETCHING; SEMICONDUCTING SILICON; SIGNAL NOISE MEASUREMENT;

FOWLER-NORDHEIM CHARACTERISTICS; GATED SILICON FIELD EMISSION DEVICES; GOLD GATE; SILICON FIELD EMISSION DEVICES;

FIELD EMISSION CATHODES;

EID: 0029546334     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (8)