mK × nK modular image sensor design

Technical Digest - International Electron Devices Meeting

Volumn , Issue , 1995, Pages 155-158

  Kreider, G ^a   Bosiers, J ^a   Dillen, B ^a   van der Heijden, J ^a   Hoekstra, W ^a   Kleimann, A ^a   Opmeer, P ^a   Oppers, J ^a   Peek, H ^a   Pellens, R ^a   Theuwissen, A ^a  

^a PHILIPS RESEARCH LABORATORIES   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

CHARGE COUPLED DEVICES; ELECTRIC CURRENTS; GATES (TRANSISTOR); LITHOGRAPHY; OPTICAL FILTERS; PRODUCT DESIGN; SILICON WAFERS;

CHARGE HANDLING CAPABILITY; ELECTRONIC SHUTTERING; LIGHT SENSITIVITY; LOW DARK CURRENT; PIXEL STRUCTURE; VERTICAL ANTI-BLOOMING;

IMAGE SENSORS;

EID: 0029544641     PISSN: 01631918     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (4)