α-particle-induced soft errors in submicron SOI SRAM

Digest of Technical Papers - Symposium on VLSI Technology

Volumn , Issue , 1995, Pages 39-40

  Tosaka, Yoshiharu ^a   Suzuki, Kunihiro ^a   Sugii, Toshihiro ^a  

^a FUJITSU LABORATORIES LTD   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITANCE; COMPUTER SIMULATION; INTEGRATION; MOS DEVICES; MOSFET DEVICES; NUMERICAL ANALYSIS; PROBABILITY; RANDOM ACCESS STORAGE; SEMICONDUCTOR DEVICE STRUCTURES; SUBSTRATES; THREE DIMENSIONAL;

BIPOLAR EFFECT; FUNNELING EFFECT; QUASI SCALING RULE; SOFT ERROR RATES; THREE DIMENSIONAL DEVICE SIMULATOR;

SILICON ON INSULATOR TECHNOLOGY;

EID: 0029544310     PISSN: 07431562     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (6)