SCOPUS 정보 검색 플랫폼

Applied Physics Letters

Volumn 67, Issue , 1995, Pages 3915-

Defect-free band-edge photoluminescence and band gap measurement of pseudomorphic Si1-x-yGexCy alloy layers on Si (100)

(5) St Amour, A a Liu, C W a Sturm, J C a Lacroix, Y b Thewalt, M L W b

a PRINCETON UNIVERSITY (United States)

b SIMON FRASER UNIVERSITY (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

AUGER ELECTRON SPECTROSCOPY; CARBON; COMPOSITION EFFECTS; ENERGY GAP; PHOTOLUMINESCENCE; SECONDARY ION MASS SPECTROMETRY; SEMICONDUCTING SILICON; STRAIN; THIN FILMS; X RAY CRYSTALLOGRAPHY;

DEFECT FREE FILMS; PSEUDOMORPHIC FILMS; SILICON GERMANIUM CARBIDE; VEGARDS LAW;

SEMICONDUCTING SILICON COMPOUNDS;

EID: 0029543599 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.115316 Document Type: Article

Times cited : (108)

References (16)

1
- 0009346115
- (1984) Bull. Alloy Phase Diag , vol.5 , pp. 486
- Olesinski, R.¹ Abbaschian, G.²

2
- 0343511339
- (1992) Appl. Phys. Lett. , vol.60 , pp. 3033
- Eberl, K.¹ Iyer, S.S.² Zollner, S.³ Tsang, J.C.⁴ LeGoues, F.K.⁵

3
- 0027702667
- (1993) Mater. Lett. , vol.18 , pp. 57
- Regolini, J.L.¹ Gisbert, F.² Dolino, G.³ Boucaud, P.⁴

4
- 0028368920
- (1994) Appl. Phys. Lett. , vol.64 , pp. 875
- Boucaud, P.¹ Francis, C.² Julien, F.H.³ Lourtioz, J.-M.⁴ Bouchier, D.⁵ Bodnar, S.⁶ Lambert, B.⁷ Regolini, J.L.⁸

5
- 84930007676
- (1991) J. Vac. Sci. Technol. B , vol.9 , pp. 2011
- Sturm, J.C.¹ Schwartz, P.V.² Prinz, E.J.³ Manoharan, H.⁴

6
- 0000830082
- (1991) Phys. Rev. Lett. , vol.66 , pp. 1362
- Sturm, J.C.¹ Manoharan, H.² Lenchyshyn, L.C.³ Thewalt, M.L.W.⁴ Rowell, N.L.⁵ Noel, J.-P.⁶ Houghton, D.C.⁷

7
- 0001652443
- (1992) Appl. Phys. Lett. , vol.60 , pp. 1720
- Xiao, X.¹ Liu, C.W.² Sturm, J.C.³ Lenchyshyn, L.C.⁴ Thewalt, M.L.W.⁵

8
- 35248858533
- (1986) Phys. Rev. B , vol.34 , pp. 5621
- Van de Walle, C.G.¹ Martin, R.M.²

9
- 0021784155
- (1985) Appl. Phys. A , vol.36 , pp. 1
- Sauer, R.¹ Weber, J.² Stolz, J.³ Weber, E.R.⁴ Küsters, K.-H.⁵ Alexander, H.⁶

10
- 0346955939
- (1974) J. Cryst. Growth , vol.27 , pp. 118
- Matthews, J.W.¹ Blakeslee, A.E.²

11
- 21544472957
- (1991) J. Appl. Phys. , vol.70 , pp. 2470
- Soref, R.A.¹

12
- 0000095243
- (1993) Phys. Rev. B , vol.48 , pp. 2207
- Demkov, A.A.¹ Sankey, O.F.²

13
- 36149024990
- (1958) Phys. Rev. , vol.109 , pp. 695
- Braustein, R.¹ Moore, A.R.² Herman, F.³

14
- 0000835293
- (1995) Phys. Rev. B , vol.51 , pp. 10568
- Neugebauer, J.¹ Van de Walle, C.G.²

15
- 21544441103
- (1994) Appl. Phys. Lett. , vol.65 , pp. 3356
- Kissinger, W.¹ Weidner, M.² Osten, H.J.³ Eichler, M.⁴

16
- 84950597672
- (in Japanese)
- Mater. Res. Soc. Symp. Proc , vol.379
- Zollner, S.¹ Herzinger, C.M.² Woollam, J.A.³ Iyer, S.S.⁴ Powell, A.P.⁵ Eberl, K.⁶

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.