Device drive current degradation observed with retrograde channel profiles

Technical Digest - International Electron Devices Meeting

Volumn , Issue , 1995, Pages 419-422

  Venkatesan, S ^a   Lutze, J W ^a   Lage, C ^a   Taylor, W J ^a  

^a MOTOROLA INC   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CMOS INTEGRATED CIRCUITS; COMPUTER SIMULATION; ELECTRIC CURRENTS; ELECTRIC DRIVES; LOGIC GATES; PERFORMANCE; SEMICONDUCTOR DEVICE MANUFACTURE; SEMICONDUCTOR DOPING;

EQUAL THRESHOLD VOLTAGE; FIXED GATE LENGTH; SATURATED DRIVE CURRENT; SHORT CHANNEL LENGTH; SUPER STEEP RETROGRADE CHANNEL;

GATES (TRANSISTOR);

EID: 0029535948     PISSN: 01631918     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (5)