Intel386 EX embedded processor IDDQ testing

IEEE International Test Conference (TC)

Volumn , Issue , 1995, Pages 902-909

  Ahuja, Hitesh ^a   Arriens, Dean ^a   Schneller, Ben ^a   Verma, Vandana ^a   Whitman, Wendy ^a  

^a INTEL CORPORATION   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CMOS INTEGRATED CIRCUITS; COMPUTER AIDED DESIGN; COMPUTER AIDED SOFTWARE ENGINEERING; COMPUTER SIMULATION; DEFECTS; ELECTRIC CURRENT MEASUREMENT; ELECTRIC CURRENTS; FAILURE ANALYSIS; GATES (TRANSISTOR); LEAKAGE CURRENTS; MATHEMATICAL MODELS;

GATE OXIDE; LEAKAGE FAULT MODEL; STUCK AT FAULT COVERAGE; TEST COVERAGE OVERLAP;

INTEGRATED CIRCUIT TESTING;

EID: 0029534554     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (6)