Pseudo-distance measure for 2D shapes based on turning angle

IEEE International Conference on Image Processing

Volumn 3, Issue , 1995, Pages 352-355

  Niblack, Wayne ^a   Yin, John ^a  

^a IBM ALMADEN RESEARCH CENTER   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; COMPUTATIONAL METHODS; DATABASE SYSTEMS; DYNAMIC PROGRAMMING; IMAGE RECONSTRUCTION; INFORMATION RETRIEVAL; INFORMATION RETRIEVAL SYSTEMS; OPTIMIZATION; VECTORS;

PSEUDO DISTANCE FUNCTION; SHAPE MATCHING; SHAPE REPRESENTATION; TURNING ANGLES; TWO DIMENSIONAL;

OBJECT RECOGNITION;

EID: 0029534439     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (9)