Pattern generation for a deterministic BIST scheme

IEEE/ACM International Conference on Computer-Aided Design, Digest of Technical Papers

Volumn , Issue , 1995, Pages 88-94

  Hellebrand, Sybille ^a   Reeb, Birgit ^a   Tarnick, Steffen ^a  

^a UNIVERSITY OF SIEGEN   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; COMPUTER AIDED DESIGN; EQUIPMENT TESTING; LOGIC DESIGN; POLYNOMIALS;

AUTOMATIC TEST PATTERN GENERATION (ATPG); BUILT IN SELF TEST (BIST) SCHEME; MULTIPLE POLYNOMIAL LINEAR FEEDBACK SHIFT REGISTERS;

SHIFT REGISTERS;

EID: 0029534112     PISSN: 10923152     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (27)