Comparison of electrostatic discharge models and failure signatures for CMOS integrated circuit devices

Electrical Overstress/Electrostatic Discharge Symposium Proceedings

Volumn , Issue , 1995, Pages 175-185

  Kelly, M ^a   Diep, T ^a   Twerefour, S ^a   Servais, G ^a   Lin, D ^a   Shah, G ^a  

^a DELPHI CORPORATION   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CMOS INTEGRATED CIRCUITS; COMPUTER SIMULATION; CORRELATION METHODS; ELECTRIC DISCHARGES; FAILURE ANALYSIS; INTEGRATED CIRCUIT TESTING; MATHEMATICAL MODELS; REGRESSION ANALYSIS; SIMULATORS;

ELECTROSTATIC DISCHARGE MODELS; FAILURE THRESHOLD VOLTAGE; FIELD-INDUCED CHARGE DEVICE MODEL; HUMAN BODY MODEL; MACHINE MODEL;

ELECTROSTATICS;

EID: 0029529070     PISSN: 07395159     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (21)