Circuit sensitivity analysis in terms of process parameters

Technical Digest - International Electron Devices Meeting

Volumn , Issue , 1995, Pages 941-944

  van Dort, M J ^a   Klaassen, D B M ^a  

^a PHILIPS RESEARCH LABORATORIES   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

CALCULATIONS; CMOS INTEGRATED CIRCUITS; COMPUTER SIMULATION; DATABASE SYSTEMS; ELECTRIC NETWORK ANALYSIS; FUNCTIONS; GATES (TRANSISTOR); LITHOGRAPHY; SEMICONDUCTOR DEVICE MODELS; SENSITIVITY ANALYSIS; THREE DIMENSIONAL;

CIRCUIT SENSITIVITY ANALYSIS; GATE DELAY; RESPONSE FUNCTIONS; RING OSCILLATOR; SHORT CHANNEL PARAMETERS;

MOSFET DEVICES;

EID: 0029521785     PISSN: 01631918     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (3)