Prediction of breakdown in SF6 under impulse conditions

Conference on Electrical Insulation and Dielectric Phenomena (CEIDP), Annual Report

Volumn , Issue , 1995, Pages 149-152

  Xu, X ^a   Jayaram, S ^a   Boggs, S A ^a  

^a UNIVERSITY OF WATERLOO   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

CARRIER CONCENTRATION; ELECTRIC BREAKDOWN; ELECTRIC FIELD EFFECTS; ELECTRIC INSULATION COORDINATION; ELECTRIC VARIABLES MEASUREMENT; ELECTRONS; IONIZATION OF GASES; MATHEMATICAL MODELS; PROBABILITY;

BREAKDOWN PROBABILITY; ELECTRON DETACHMENT; FAST TRANSIENT VOLTAGE BREAKDOWN; GAS INSULATED SUBSTATION; ION CONCENTRATION; SULFUR HEXAFLUORIDE;

SULFUR COMPOUNDS;

EID: 0029521656     PISSN: 00849162     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (8)