Extended study of crosstalk in SOI-SIMOX substrates

Technical Digest - International Electron Devices Meeting

Volumn , Issue , 1995, Pages 713-716

  Viviani, A ^a   Raskin, J P ^a   Flandre, D ^a   Colinge, J P ^a   Vanhoenacker, D ^a  

^a UNIVERSITÉ CATHOLIQUE DE LOUVAIN   (Belgium)

Author keywords

[No Author keywords available]

Indexed keywords

CMOS INTEGRATED CIRCUITS; COMPUTER SIMULATION; CROSSTALK; ELECTRIC CONDUCTIVITY; ELECTRIC NETWORK ANALYZERS; ELECTRIC VARIABLES MEASUREMENT; MOS DEVICES; PROBES; SEMICONDUCTING SILICON; SEMICONDUCTOR DEVICE TESTING; SUBSTRATES;

DRAIN SOURCE DIFFUSION; MICROWAVE PADS; ON WAFER MEASUREMENT; TWO DIMENSIONAL DEVICE SIMULATION; VECTOR NETWORK ANALYZERS;

SILICON ON INSULATOR TECHNOLOGY;

EID: 0029520366     PISSN: 01631918     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (7)