Transient power supply current testing of digital CMOS circuits

IEEE International Test Conference (TC)

Volumn , Issue , 1995, Pages 892-901

  Makki, Rafic Z ^a   Su, Shyang Tai ^a   Nagle, Troy ^a  

^a UNIVERSITY OF NORTH CAROLINA AT CHARLOTTE   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CMOS INTEGRATED CIRCUITS; CONTROLLABILITY; DIGITAL INTEGRATED CIRCUITS; ELECTRIC CURRENTS; ERROR DETECTION; LOGIC CIRCUITS; OBSERVABILITY; POWER SUPPLY CIRCUITS; SWITCHING; SWITCHING CIRCUITS; SWITCHING FUNCTIONS;

POWER TREE DISTRIBUTION; TEMPORARY PATH; TRANSIENT POWER SUPPLY CURRENT TESTING;

INTEGRATED CIRCUIT TESTING;

EID: 0029519859     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (32)