Guard ring diodes for suppression of substrate noise and improved reliability in mixed-mode CMOS circuits

Proceedings of the International Symposium on the Physical 7 Failure Analysis of Integrated Circuits, IPFA

Volumn , Issue , 1995, Pages 145-148

  Forbes, L ^a   Lim, W T ^a   Yan, K T ^a  

^a OREGON STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AMPLIFIERS (ELECTRONIC); CAPACITANCE; CMOS INTEGRATED CIRCUITS; COMPUTER SIMULATION; ELECTRIC INVERTERS; FREQUENCIES; INTERFERENCE SUPPRESSION; RELIABILITY; SPURIOUS SIGNAL NOISE; SUBSTRATES;

GUARD RING DIODES; LEAD INDUCTANCE; MIXED MODE CMOS CIRCUITS; SUBSTRATE NOISE;

SEMICONDUCTOR DIODES;

EID: 0029519757     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (7)