Evaluation of modern IGBT-modules for hard-switched AC/DC/AC converters

Conference Record - IAS Annual Meeting (IEEE Industry Applications Society)

Volumn 2, Issue , 1995, Pages 997-1005

  Blaabjerg, Frede ^a   Pedersen, John K ^a   Jaeger, Ulrik ^a  

^a AALBORG UNIVERSITY   (Denmark)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC CURRENTS; ELECTRIC LOSSES; ELECTRIC POWER FACTOR; ELECTRIC VARIABLES MEASUREMENT; POWER CONVERTERS; SEMICONDUCTOR DEVICE TESTING; SEMICONDUCTOR DIODES; SIMULATION; SWITCHING; THERMAL EFFECTS;

CONDUCTION LOSSES; INSULATED GATE BIPOLAR TRANSISTORS; JUNCTION TEMPERATURE; LOAD CURRENT; MODULATION INDEX; NON PUNCH THROUGH TECHNOLOGY; PUNCH THROUGH TECHNOLOGY; SWITCHING FREQUENCY; SWITCHING LOSSES;

BIPOLAR TRANSISTORS;

EID: 0029519654     PISSN: 01972618     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (7)