Effects of bias field and driving current on the equivalent circuit response of magnetoimpedance in amorphous wires

Journal of Physics D: Applied Physics

Volumn 28, Issue 12, 1995, Pages 2404-2410

  Valenzuela, R ^b   Knobel, M ^b   Vazquez, M ^a   Hernando, A ^a  

^a INSTITUTO DE MAGNETISMO APLICADO   (Spain)

^b UNIVERSITY OF CAMPINAS   (Brazil)

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS WIRES; BIAS FIELD; DOMAIN WALL CONTRIBUTIONS; EQUIVALENT CIRCUIT RESPONSE; MAGNETIC STRUCTURE; MAGNETO IMPEDANCE;

AMORPHOUS ALLOYS; APPROXIMATION THEORY; COBALT ALLOYS; ELECTRIC CURRENTS; ELECTRIC IMPEDANCE; EQUIVALENT CIRCUITS; FREQUENCY RESPONSE; MAGNETIC DOMAINS; MAGNETIC FIELD EFFECTS; MAGNETIC PERMEABILITY; MAGNETIZATION; WIRE;

FERROMAGNETIC MATERIALS;

EID: 0029519412     PISSN: 00223727     EISSN: 13616463     Source Type: Journal    
DOI: 10.1088/0022-3727/28/12/003     Document Type: Article

References (14)

1. Machado F L A, da Silva B L, Rezende S M and Martins C 1994 J. Appl. Phys. 75 6563
2. Beach R S and Berkowitz A E 1994 J. AppL Phys. 76 6209
3. Panina L V, Mohri K, Bushida K and Noda M 1994 J. Appl. Phys. 76 6198
4. Rao K V, Humphrey F B and Costa-Krâmer J L 1994 J. Appl. Phys. 76 6204
5. Knobel M, G6tnez-Polo C, Hernando A, Marin P and Vazque, Z 1995 to be published
6. Valenzuela R, Knobel M, Vazquez M and Hernando A 1995 J. Appl. Phys. at press
7. Waseda Y, Ueno S, Hagiwara M and Aust K T 1990 Prog. Mater. Sci. 34 149
8. Yamasaki J, Mohri K, Kawamura H, Takamura H, Humphrey F B and Malmhall R 1989 IEEE Translation J. Magn. Japan 4 360
9. Theuss H, Hofmann B, G6mez-Polo C, Vâzquez M and Krdnmuller H 1995 J. Magn. Magn. Mater. 145 165
10. Beach R S and Berkowitz A E 1994 Appl. Phys. Lett. 64 3652
11. Panina L V and Mohri K 1994 Appl. Phys. Lett. 65 1189
12. Irvine J T S, Amano E, Huanosta A, Valenzuela R and West A R 1990 Solid State Ionics 40/41 220
13. Amano E, Valenzuela R, Irvine J T S and West A R 1990 J. Appl. Phys. 67 5589
14. Valenzuela R and Irvine J T S 1992 J. Appl. Phys. 72 1486