Magnetic structure determination for annealed Ni80Fe20/Ag multilayers using polarized-neutron reflectivity

Materials Research Society Symposium - Proceedings

Volumn 376, Issue , 1995, Pages 577-582

  Borchers, J A ^a   Gehring, P M ^a   Majkrzak, C F ^a   Ankner, J F ^a   Hylton, T L ^a   Coffey, K R ^a   Parker, M A ^a   Howard, J K ^a  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; CHARACTERIZATION; CRYSTAL STRUCTURE; MAGNETIC FIELDS; MAGNETIC MOMENTS; MAGNETIZATION; MORPHOLOGY; MULTILAYERS; NICKEL ALLOYS; SILVER; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION;

MAGNETIC STRUCTURE DETERMINATION; MAGNETIZATION DEPTH; POLARIZED NEUTRON SPECULAR REFLECTIVITY; SATURATION FIELD;

MAGNETIC MATERIALS;

EID: 0029519394     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (14)