Universal test complexity of field-programmable gate arrays

Proceedings of the Asian Test Symposium

Volumn , Issue , 1995, Pages 259-265

  Inoue, Tomoo ^a   Fujiwara, Hideo ^a   Michinishi, Hiroyuki ^a   Yokohira, Tokumi ^a   Okamoto, Takuji ^a  

^a NARA INSTITUTE OF SCIENCE AND TECHNOLOGY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

APPLICATION SPECIFIC INTEGRATED CIRCUITS; CELLULAR ARRAYS; COMBINATORIAL CIRCUITS; COMPUTATIONAL COMPLEXITY; COMPUTER ARCHITECTURE; COMPUTER PROGRAMMING; RANDOM ACCESS STORAGE; TABLE LOOKUP;

FIELD PROGRAMMABLE GATE ARRAYS; RANDOM ACCESS LOADING; SEQUENTIAL LOADING; UNIVERSAL TEST COMPLEXITY;

LOGIC GATES;

EID: 0029519091     PISSN: 10817735     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (8)