Front gate charge pumping technique for measuring both interfaces in fully depleted SOI/MOSFETs

Technical Digest - International Electron Devices Meeting

Volumn , Issue , 1995, Pages 643-646

  Li, Yujun ^a   Wang, Guobin ^a   Ma, T P ^a  

^a YALE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; ELECTRIC CURRENTS; GATES (TRANSISTOR); INTERFACES (MATERIALS); RELIABILITY; SILICON ON INSULATOR TECHNOLOGY; SILICON WAFERS; THIN FILM TRANSISTORS;

CHARGE PUMPING TECHNIQUE; SIMOX WAFERS;

MOSFET DEVICES;

EID: 0029517851     PISSN: 01631918     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (4)