High-performance circuit testing with slow-speed testers

IEEE International Test Conference (TC)

Volumn , Issue , 1995, Pages 302-310

  Agrawal, Vishwani D ^a   Chakraborty, Tapan J ^a  

^a LUCENT TECHNOLOGIES   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AUTOMATIC TESTING; COMPUTER AIDED DESIGN; COMPUTER HARDWARE; DELAY CIRCUITS; DIGITAL DEVICES; FAILURE ANALYSIS; FLIP FLOP CIRCUITS; INTEGRATED CIRCUIT LAYOUT; TIMING CIRCUITS; WAVEFORM ANALYSIS;

AUTOMATIC TEST EQUIPMENT; CLOCK FREQUENCY; CLOCK WAVEFORM; HIGH PERFORMANCE CIRCUIT TESTING; SLOW SPEED TESTERS;

INTEGRATED CIRCUIT TESTING;

EID: 0029514577     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (21)