Test synthesis in the behavioral domain

IEEE International Test Conference (TC)

Volumn , Issue , 1995, Pages 693-702

  Papachristou, Christos ^a   Carletta, Joan ^a  

^a CASE WESTERN RESERVE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTATIONAL COMPLEXITY; COMPUTER HARDWARE DESCRIPTION LANGUAGES; CONTROLLABILITY; CRITICAL PATH ANALYSIS; INTEGRATED CIRCUIT LAYOUT; INTEGRATED CIRCUIT TESTING; OBSERVABILITY;

BEHAVIORAL DOMAIN; BEHAVIORAL TEST QUALITY METRICS; BUILT IN SELF TEST; DATAPATH; DESIGN FOR TESTABILITY; TESTABILITY INSERTION;

VLSI CIRCUITS;

EID: 0029510950     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (18)