Probing metal defects in CCD image sensors

Materials Research Society Symposium - Proceedings

Volumn 378, Issue , 1995, Pages 713-724

  McColgin, William C ^a   Lavine, J P ^a   Stancampiano, C V ^a  

^a EASTMAN KODAK COMPANY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CHARGE COUPLED DEVICES; COBALT; DEFECTS; ELECTRIC CURRENTS; ELECTRON ENERGY LEVELS; GOLD; HEAVY METALS; IMAGE ANALYSIS; IRON; NICKEL; SPECTROSCOPY; THERMAL EFFECTS;

CHARGE COUPLED DEVICE IMAGE SENSORS; DARK CURRENT SPECTROSCOPY; DEEP LEVEL TRAPS; HISTOGRAMS; PIXEL DEFECTS;

IMAGE SENSORS;

EID: 0029504480     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1557/proc-378-713     Document Type: Conference Paper

References (33)