Test circuits for verification of power device models

Conference Record - IAS Annual Meeting (IEEE Industry Applications Society)

Volumn 2, Issue , 1995, Pages 1055-1060

  Pendharkar, S ^a   Winterhalter, C ^a   Trivedi, M ^a   Li, H ^a   Kurnia, A ^a   Divan, D ^a   Shenai, K ^a  

^a UNIVERSITY OF WISCONSIN MADISON   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BIPOLAR TRANSISTORS; CAPACITANCE; COMPUTER SIMULATION; CURRENT VOLTAGE CHARACTERISTICS; ELECTRIC BREAKDOWN; ELECTRIC VARIABLES MEASUREMENT; FINITE ELEMENT METHOD; MOSFET DEVICES; POWER CONVERTERS; SEMICONDUCTOR DIODES; THERMODYNAMIC PROPERTIES; TOPOLOGY;

CIRCUIT PARASITICS; MIXED CIRCUIT; TEST CIRCUITS;

SEMICONDUCTOR DEVICE MODELS;

EID: 0029501724     PISSN: 01972618     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (6)