Seu Fault Tolerance in Artificial Neural Networks

IEEE Transactions on Nuclear Science

Volumn 42, Issue 6, 1995, Pages 1856-1862

  Velazco, R ^a   Assoum, A ^b   Radi, N E ^b   Ecoffet, R ^c   Botey, X ^d  

^a Laboratoire de Génie Informatique   (France)

^b Centre National d'Etudes Spatiales ^*

^c CNES   (France)

^d UNIVERSITAT POLITÈCNICA DE CATALUNYA   (Spain)

Author keywords

[No Author keywords available]

Indexed keywords

DIGITAL SIGNAL PROCESSING; FAULT TOLERANT COMPUTER SYSTEMS; MATHEMATICAL MODELS; RADIATION EFFECTS; ROBUSTNESS (CONTROL SYSTEMS); VLSI CIRCUITS;

DIGITAL NEURAL CIRCUITS; SINGLE EVENT UPSET (EU);

NEURAL NETWORKS;

EID: 0029493358     PISSN: 00189499     EISSN: 15581578     Source Type: Journal    
DOI: 10.1109/23.489227     Document Type: Article

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