Single Event Upset Rates on 1 Mbit and 256 Kbit Memories: CRUX Experiment on APEX

IEEE Transactions on Nuclear Science

Volumn 42, Issue 6, 1995, Pages 1964-1974

  Adolphsen, John ^a   Barth, Janet L ^b   Stassinopoulos, E G ^c   Gruner, Timothy ^c   Wennersten, Miriam ^c   LaBel, Kenneth A ^c   Seidleck, Christina M ^d  

^a Unisys   (United States)

^b NASA GODDARD SPACE FLIGHT CENTER   (United States)

^c HUGHES ST Systems ^*

^d Hughes   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ERROR ANALYSIS; MATHEMATICAL MODELS; MILITARY SATELLITES; PROTONS; RADIATION EFFECTS; SPACE APPLICATIONS; STORAGE ALLOCATION (COMPUTER);

ADVANCED PHOTOVOLTAIC AND ELECTRONICS EXPERIMENT (APEX); APEX AIR FORCE SATELLITE; SINGLE EVENT UPSET (SEU); STATIC RANDOM ACCESS MEMORY (SRAM);

RANDOM ACCESS STORAGE;

EID: 0029491117     PISSN: 00189499     EISSN: 15581578     Source Type: Journal    
DOI: 10.1109/23.489241     Document Type: Article

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