Extending the SKIPSM binary skeletonization implementation

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 2597, Issue , 1995, Pages 92-100

  Hujanen, Ahti A ^a   Waltz, Frederick M ^a  

^a 3M COMPANY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

FINITE STATE MACHINES; SEPARATED-KERNEL IMAGE PROCESSING; SKELETONIZATION;

ALGORITHMS; FINITE AUTOMATA; INSPECTION; PATTERN RECOGNITION; PIPELINE PROCESSING SYSTEMS; PRINTED CIRCUIT BOARDS;

IMAGE PROCESSING;

EID: 0029490972     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (24)