SCOPUS 정보 검색 플랫폼

Materials Science and Engineering A

Volumn 204, Issue 1-2, 1995, Pages 7-11

Residual stress, strain and faults in nanocrystalline palladium and copper

(5) Sanders, P G a Witney, A B a Weertman, J R a Valiev, R Z b Siegel, R W c

a NORTHWESTERN UNIVERSITY (United States)

b INSTITUTE FOR METALS SUPERPLASTICITY PROBLEMS (Russian Federation)

c ARGONNE NATIONAL LABORATORY (United States)

Author keywords

Copper; Faults; Nanocrystalline; Palladium; Strain

Indexed keywords

COMPACTION; CONDENSATION; COPPER; CRYSTAL STRUCTURE; ELASTICITY; GRAIN SIZE AND SHAPE; PALLADIUM; PLASTIC DEFORMATION; RESIDUAL STRESSES; STACKING FAULTS; STRAIN; X RAY DIFFRACTION;

ASYMMETRY; INERT GAS CONDENSATION; LINE BROADENING; NANOCRYSTALLINE COPPER; NANOCRYSTALLINE PALLADIUM; PEAK SHIFT; TWIN PROBABILITY; WARM COMPACTION; WARREN-AVERBACH TECHNIQUE; YOUNG MODULUS;

NANOSTRUCTURED MATERIALS;

EID: 0029488938 PISSN: 09215093 EISSN: None Source Type: Journal
DOI: 10.1016/0921-5093(95)09928-X Document Type: Article

Times cited : (78)

References (16)

1
- 0024106414
- Synthesis, characterization, and properties of nanophase TiO2
- (1988) Journal of Materials Research , vol.2 , pp. 1367
- Siegel¹ Ramasamy² Hahn³ Li⁴ Lu⁵ Gronsky⁶

2
- 0028272658
- (1994) Scripta Metall. Mater. , vol.30 , pp. 229
- Gertsman¹ Birringer² Valiev³ Gleiter⁴

3
- 0003472812
- Dover, New York
- (1990) X-ray Diffraction , pp. 251-298
- Warren¹

4
- 0000345778
- (1948) Proc. Phys. Soc. London , vol.61 , pp. 382
- Stokes¹

5
- 84914972682
- (1969) Adv. X-ray Anal. , vol.12 , pp. 304
- Rothman¹ Cohen²

6
- 0001038393
- (1962) J. Appl. Phys. , vol.33 , pp. 2073
- Cohen¹ Wagner²

7
- 0003631606
- Springer, New York
- (1987) Residual Stress , pp. 117-209
- Noyan¹ Cohen²

8
- 0003798546
- MIT Press, Cambridge, MA
- (1971) Single Crystal Elastic Constants and Calculated Aggregate Properties: A Handbook , pp. 233
- Simmons¹ Wang²

9
- 0004257242
- Addison-Wesley, Reading, MA
- (1957) Introduction to the Theory of Error , pp. 26-36
- Beers¹

10
- 0013481251
- Statistical variance of line-profile parameters. Measures of intensity location and dispersion
- (1967) Acta Crystallographica , vol.23 , pp. 888
- Wilson¹

11
- 0042720172
- On-line Fourier analysis of the shapes of X-ray diffraction peaks
- (1983) Journal of Applied Crystallography , vol.16 , pp. 304
- Schlosberg¹ Cohen²

12
- 0003400307
- J.B. Cohen, J.E. Hilliard, Gordon and Breach, New York
- (1966) Local Atomic Arrangements Studied by X-ray Diffraction , pp. 289-340
- Mikkola¹ Cohen²

13
- 0009275291
- Matrials Research Society, Pittsburgh, PA
- (1991) Materials Research Society Symp. Proc. , vol.206 , pp. 493
- Nieman¹ Weertman² Siegel³

14
- 0017490930
- (1977) Jpn. J. Appl. Phys. , vol.16 , pp. 705
- Hayashi¹ Ohno² Yaisuya³ Uyeda⁴

15
- 0029481049
- Young's modulus of nanocrystalline Fe measured by nanoindentation
- (1995) Materials Science and Engineering: A , vol.204 A , pp. 106
- Fougere¹ Riester² Ferber³ Weertman⁴ Siegel⁵

16
- 84914960019
- M.L. Peterson, personal communication, 1994.

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.