Chemical identification of defect impurities using radioactive isotopes

Materials Science Forum

Volumn 196-201, Issue pt 3, 1995, Pages 1497-1502

  Daly, S E ^a   Henry, M O ^a   Frehill, C A ^a   Freitag, K ^a   Vianden, R ^a   Rohrlack, G ^a   Forkel, D ^a  

^a DUBLIN CITY UNIVERSITY   (Ireland)

Author keywords

[No Author keywords available]

Indexed keywords

ARSENIC; CRYSTAL DEFECTS; CRYSTAL IMPURITIES; ELECTRIC CONDUCTIVITY MEASUREMENT; HALL EFFECT; INDIUM; ION IMPLANTATION; MERCURY (METAL); PHOTOLUMINESCENCE; SEMICONDUCTING GALLIUM ARSENIDE; SEMICONDUCTING SILICON; SPECTROSCOPY;

CHEMICAL IDENTIFICATION; DEFECT IMPURITIES; RADIOACTIVE HALF LIFE;

RADIOISOTOPES;

EID: 0029488106     PISSN: 02555476     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.4028/www.scientific.net/msf.196-201.1497     Document Type: Article

References (12)