Novel methodology for statistical parameter extraction

IEEE/ACM International Conference on Computer-Aided Design, Digest of Technical Papers

Volumn , Issue , 1995, Pages 696-699

  Krishna, Kannan ^a   Director, S W ^a  

^a CARNEGIE MELLON UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

MOS DEVICES; PARAMETER ESTIMATION; PROBABILITY DENSITY FUNCTION; SEMICONDUCTOR DEVICE MODELS; STATISTICAL METHODS;

MODELLING ERROR VARIATIONS; STATISTICAL PARAMETER EXTRACTION;

INTEGRATED CIRCUIT MANUFACTURE;

EID: 0029487856     PISSN: 10923152     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (10)