Design based analog testing by characteristic observation inference

IEEE/ACM International Conference on Computer-Aided Design, Digest of Technical Papers

Volumn , Issue , 1995, Pages 620-626

  Lindermeir, Walter M ^a   Graeb, Helmut E ^a   Antreich, Kurt J ^a  

^a TECHNICAL UNIVERSITY OF MUNICH   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTATIONAL METHODS; INTEGRATED CIRCUIT LAYOUT; INTEGRATED CIRCUIT TESTING; MATHEMATICAL MODELS;

CHARACTERISTIC OBSERVATION INFERENCE; DESIGN BASED ANALOG TESTING; LOGISTIC DISCRIMINATION ANALYSIS; PARAMETRIC FAULTS;

LINEAR INTEGRATED CIRCUITS;

EID: 0029487688     PISSN: 10923152     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (16)