Low voltage hot carrier effects and stress methodology

International Symposium on VLSI Technology, Systems, and Applications, Proceedings

Volumn , Issue , 1995, Pages 277-280

  Aur, Shian ^a  

^a TEXAS INSTRUMENTS   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CURRENT VOLTAGE CHARACTERISTICS; ELECTRONS; MATHEMATICAL MODELS; MAXWELL EQUATIONS; STRESSES; SUBSTRATES;

HIGH ENERGY TAIL; HOT ELECTRON BARRIER; HOT ELECTRON DISTRIBUTION; LOW VOLTAGE HOT CARRIER EFFECTS; STRESS METHODOLOGY;

HOT CARRIERS;

EID: 0029483063     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (4)