Suppression of geometric component of charge-pumping current in SOI/MOSFETs

International Symposium on VLSI Technology, Systems, and Applications, Proceedings

Volumn , Issue , 1995, Pages 144-148

  Li, Yujun ^a   Ma, T P ^a  

^a YALE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CHARGE CARRIERS; DATA REDUCTION; DIODES; ELECTRIC CURRENTS; ELECTRONS; GATES (TRANSISTOR); INTERFACES (MATERIALS); MOSFET DEVICES; SEMICONDUCTING SILICON; WSI CIRCUITS;

CHARGE PUMPING CURRENT; GEOMETRIC COMPONENT; PARASITIC EFFECT;

SILICON ON INSULATOR TECHNOLOGY;

EID: 0029482301     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (3)