Correlation between yield and waiting time: a quantitative study

Proceedings of the IEEE/CPMT International Electronic Manufacturing Technology (IEMT) Symposium

Volumn , Issue , 1995, Pages 65-69

  Srinivasan, Krishna ^a   Sandell, Raka ^a   Brown, Steven ^a  

^a MOTOROLA INC   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; LOGIC DEVICES; OPERATIONS RESEARCH; PROCESS ENGINEERING; PRODUCTION CONTROL; QUEUEING THEORY; SCHEDULING; SEMICONDUCTOR MATERIALS;

CYCLE TIME; QUEUING TIMES; SEMICONDUCTOR WAFER FABRICATION; YIELD AND WAITING TIME;

SEMICONDUCTOR DEVICE MANUFACTURE;

EID: 0029478868     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (8)