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Volumn , Issue , 1995, Pages 322-330
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ESD failure mechanisms of inductive and magnetoresistive recording heads
a
a
IBM
(United States)
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Author keywords
[No Author keywords available]
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Indexed keywords
COMPUTER SIMULATION;
ELECTRIC DISCHARGES;
ELECTROSTATICS;
FAILURE ANALYSIS;
MAGNETIC RECORDING;
MAGNETORESISTANCE;
THIN FILM DEVICES;
TRANSIENTS;
AMPLITUDE ROADBACK SIGNAL;
ELECTROSTATIC DISCHARGE;
ELECTROSTATIC THEORY;
HUMAN BODY MODEL TRANSIENT;
INDUCTIVE RECORDING HEADS;
MACHINE MODEL TRANSIENT;
MAGNETORESISTIVE RECORDING HEADS;
METALIZATION BURN OUT;
MAGNETIC HEADS;
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EID: 0029478201
PISSN: 07395159
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1109/eosesd.1995.478300 Document Type: Conference Paper |
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Times cited : (36)
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References (19)
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