Analysis of snubber-clamped diode-string mixed voltage interface ESD protection network for advanced microprocessors

Electrical Overstress/Electrostatic Discharge Symposium Proceedings

Volumn , Issue , 1995, Pages 43-61

  Voldman, Steven H ^a   Gerosa, Gianfranco ^a   Gross, Vaughn P ^a   Dickson, Nicholas ^a   Furkay, Stephen ^a   Slinkman, James ^a  

^a IBM MICROELECTRONICS   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CIRCUIT THEORY; CMOS INTEGRATED CIRCUITS; ELECTRIC DISCHARGES; ELECTRIC NETWORK SYNTHESIS; ELECTROSTATICS; MATHEMATICAL MODELS; MICROPROCESSOR CHIPS; SEMICONDUCTOR DIODES;

ELECTROSTATIC DISCHARGE; ELECTROTHERMAL SIMULATION; SHALLOW TRENCH ISOLATION; SNUBBER CLAMPED DIODE STRING; VOLTAGE INTERFACES;

ELECTRIC EQUIPMENT PROTECTION;

EID: 0029477105     PISSN: 07395159     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/eosesd.1995.478267     Document Type: Conference Paper

References (30)