Scanning near-field optical microscopy (SNOM) and its application in mineralogy

Schweizerische Mineralogische und Petrographische Mitteilungen

Volumn 75, Issue 2, 1995, Pages 259-264

  Gutmannsbauer, W ^a   Huser, T ^a   Lacoste, T ^a   Heinzelmann, H ^a   Guntherodt, H J ^a  

^a UNIVERSITY OF BASEL   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

DIFFRACTION LIMIT; OPTICAL MICROSCOPY; RESOLUTION; SCANNING FORCE MICROSCOPY; SCANNING NEAR FIELD OPTICAL MICROSCOPY; SHEAR FORCE IMAGE;

EID: 0029473579     PISSN: 00367699     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (0)