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Volumn 2, Issue , 1995, Pages 1486-1489
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Study of ion microchannels and IEC grid effects using the SIMION code
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Author keywords
[No Author keywords available]
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Indexed keywords
COMPUTER SIMULATION;
ELECTRIC FIELDS;
ELECTROSTATIC DEVICES;
INERTIAL CONFINEMENT FUSION;
IONS;
NEUTRON SOURCES;
PARTICLE BEAM DYNAMICS;
INERTIAL ELECTROSTATIC CONFINEMENT;
ION MICROCHANNELS;
ION TRAJECTORY CODE;
SIMION CODE;
STAR MODE;
TWO DIMENSIONAL;
CATHODES;
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EID: 0029461789
PISSN: None
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
Times cited : (6)
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References (12)
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