Thermal deposition analysis during disruptions on DIII-D using infrared scanners

Proceedings - Symposium on Fusion Engineering

Volumn 2, Issue , 1995, Pages 902-905

  Lee, R L ^a   Lasnier, C J ^a   Hyatt, A W ^a   Kellman, A G ^a   Taylor, P L ^a  

^a GENERAL ATOMICS   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CHARACTERIZATION; ENERGY DISSIPATION; HEAT FLUX; PLASMAS; SCANNING; SEMICONDUCTING ZINC COMPOUNDS; TEMPERATURE MEASUREMENT; TOKAMAK DEVICES;

DISRUPTIONS; HEAT DEPOSITION; INFRARED SCANNERS; PLASMA CURRENT; PLASMA DISCHARGES; THERMAL DEPOSITION ANALYSIS; THERMAL ENERGY;

INFRARED DEVICES;

EID: 0029457979     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (2)