Total dose effects on elementary transistors of a comparator in bipolar technology

Proceedings of the European Conference on Radiation and its Effects on Components and Systems, RADECS

Volumn , Issue , 1995, Pages 223-229

  Bosc, J M ^a   Sarrabayrouse, G ^a   Guerre, F X ^a  

^a MOTOROLA INC   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BIPOLAR TRANSISTORS; DEGRADATION; DOSIMETRY; ELECTROMAGNETIC WAVE POLARIZATION; INTEGRATED CIRCUIT MANUFACTURE; INTEGRATED CIRCUIT TESTING; IRRADIATION; MASKS; RADIATION EFFECTS;

BIAS CONDITION EFFECTS; ELECTRONIC FUNCTION DEGRADATIONS; ELEMENTARY TRANSISTORS; JUNCTION ISOLATION BIPOLAR TECHNOLOGY; TOTAL DOSE EFFECTS;

COMPARATOR CIRCUITS;

EID: 0029453733     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (9)