Process dependence of the capacitance of silicon microstrip detectors

IEEE Nuclear Science Symposium & Medical Imaging Conference

Volumn 1, Issue , 1995, Pages 196-200

  Wheadon, R ^a   Tonelli, G ^a   Bilei, G M ^a   Bartalini, P ^a   Hall, G ^a  

^a INFN SEZIONE DI PISA   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITANCE; CAPACITANCE MEASUREMENT; ENERGY UTILIZATION; ETCHING; LINEAR ACCELERATORS; MICROSTRIP DEVICES; SPURIOUS SIGNAL NOISE;

POLYSILICON BIASING; READOUT ELECTRONICS; SILICON MICROSTRIP DETECTORS; STRIP CAPACITANCE;

SILICON SENSORS;

EID: 0029452879     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (0)