Low noise and high tolerance to radiation effects of complementary bipolar SOI IC technology

IEEE Radiation Effects Data Workshop

Volumn , Issue , 1995, Pages 78-84

  Pawlikiewicz, A H ^a   Bishop, A ^a   Jerome, R ^a  

^a United Technologies Kidde   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BIPOLAR INTEGRATED CIRCUITS; BIPOLAR TRANSISTORS; DOSIMETRY; IRRADIATION; SILICON ON INSULATOR TECHNOLOGY;

BIPOLAR PROCESSES; HIGH TOLERANCE; LOW NOISE; POLARITY;

RADIATION EFFECTS;

EID: 0029431258     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (14)