Single event upset and latchup measurements in avionics devices using the WNR neutron beam and a new neutron-induced latchup model

IEEE Radiation Effects Data Workshop

Volumn , Issue , 1995, Pages 33-38

  Normand, E ^a   Wert, J L ^a   Majewski, P P ^a   Oberg, D L ^a   Bartholet, W G ^a   Davis, S K ^a   Shoga, M ^a   Wender, S A ^a   Gavron, A ^a  

^a RAYTHEON COMPANY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

SINGLE EVENT LATCHUP MODEL; SINGLE EVENT UPSET; WEAPONS NEUTRON RESEARCH;

CMOS INTEGRATED CIRCUITS; COMPUTER SOFTWARE; MODELS; NEUTRONS; PROTONS; RADIATION EFFECTS; SIMULATION; TEST FACILITIES;

AVIONICS;

EID: 0029429016     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (11)