Electrostatic Discharge Damage of MR Heads

IEEE Transactions on Magnetics

Volumn 31, Issue 6, 1995, Pages 2624-2626

  Tian, Hong ^a   Lee, Jerry J K ^a  

^a Conner Peripherals ^*  (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITORS; COMPUTER SIMULATION; DEFECTS; ELECTRIC BREAKDOWN; ELECTRIC CURRENTS; ELECTRIC DISCHARGES; ELECTRIC RESISTANCE; ELECTROSTATICS; MAGNETORESISTANCE; RESISTORS; SENSORS; THERMAL EFFECTS;

ELECTROSTATIC DISCHARGE DAMAGE; ELECTROTHERMAL DAMAGE; MAGNETORESISTIVE HEADS; MAGNETORESISTIVE SENSORS;

MAGNETIC HEADS;

EID: 0029410061     PISSN: 00189464     EISSN: 19410069     Source Type: Journal    
DOI: 10.1109/20.490073     Document Type: Article

References (5)

1. J. McAteer, Electrostatic Discharge Control, McGraw-Hill, 1990.
2. EOS/ESD Symposium Proceedings, 1979–1994.
3. EOS/ESD S5.1, Standard for ESD sensitivity Testing — HBM Component Level, EOS/ESD Association, 1991.
4. Wunsch and R.R. Bell, IEEE Transactions on Nuclear Science, vol. NS-15, 244–59, December, 1968.
5. A. J. Wallash and T. H. Hughbanks, EOS/ESD Symposium Proceedings, pp. 273–278, 1994.