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Volumn 31, Issue 6, 1995, Pages 3865-3867

Influence of Grain Size on the Transport Properties of Ni80Fe20 and Cu Thin Films

(8) Rijks, Th G S M a,b Sour, R L H a,b De Jonge, W J M a Neerinck, D G b De Veirman, A E M b Coehoorn, R b Kools, J C S b Gillies, M F c

a EINDHOVEN UNIVERSITY OF TECHNOLOGY (Netherlands)

b PHILIPS RESEARCH LABORATORIES (Netherlands)

c UNIVERSITY OF GLASGOW (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

COPPER; ELECTRIC CONDUCTIVITY MEASUREMENT; ELECTRIC CONDUCTIVITY OF SOLIDS; ELECTRON SCATTERING; ELECTRON TRANSPORT PROPERTIES; GRAIN BOUNDARIES; GRAIN SIZE AND SHAPE; MATHEMATICAL MODELS; MULTILAYERS; NICKEL ALLOYS; TANTALUM;

GRAIN BOUNDARY SCATTERING; SPIN DEPENDENCE;

MAGNETIC THIN FILMS;

EID: 0029409712 PISSN: 00189464 EISSN: 19410069 Source Type: Journal
DOI: 10.1109/20.489798 Document Type: Article

Times cited : (30)

References (13)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.