High resolution electron microscopy and nano-probe study of CoSm // Cr films

IEEE Transactions on Magnetics

Volumn 31, Issue 6, 1995, Pages 2740-2742

  Liu, Y ^a,a   Sellmyer, D J ^a,a   Robertson, B W ^a,a   Shan, Z S ^a,a   Liou, S H ^a,a  

^a UNIVERSITY OF NEBRASKA LINCOLN   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COBALT ALLOYS; CRYSTAL STRUCTURE; DEPOSITION; ELECTRON MICROSCOPY; GRAIN SIZE AND SHAPE; MAGNETIC RECORDING; MAGNETRON SPUTTERING; NANOSTRUCTURED MATERIALS; NANOTECHNOLOGY; STACKING FAULTS; TRANSMISSION ELECTRON MICROSCOPY; X RAY SPECTROSCOPY;

COBALT SAMARIUM; NANODIFFRACTION; NANOMETER PROBE;

MAGNETIC THIN FILMS;

EID: 0029409567     PISSN: 00189464     EISSN: 19410069     Source Type: Journal    
DOI: 10.1109/20.490109     Document Type: Article

References (8)

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