Phase-shifting real-time holographic interferometry that uses bismuth silicon oxide crystals

Applied Optics

Volumn 34, Issue 32, 1995, Pages 7497-7506

  Georges, M P ^a   Lemaire, Ph C ^a  

^a UNIVERSITY OF LIÈGE   (Belgium)

Author keywords

Holographic materials; Holography; Holography applications; Interferometry; Metrology; Nondestructive testing; Photorefractive materials

Indexed keywords

ALGORITHMS; CRYSTALS; DEFORMATION; DIFFRACTION; DIFFUSION; ERROR ANALYSIS; HOLOGRAPHIC INTERFEROMETRY; NONDESTRUCTIVE EXAMINATION; PHASE SHIFT;

ANISOTROPIC SELF-DIFFRACTION; BISMUTH SILICON OXIDE; INTERFEROGRAM-ANALYSIS METHOD; PHOTOREFRACTIVE MATERIALS;

BISMUTH COMPOUNDS;

EID: 0029409528     PISSN: 1559128X     EISSN: 21553165     Source Type: Journal    
DOI: 10.1364/AO.34.007497     Document Type: Article

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