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Physical Review Letters

Volumn 75, Issue 20, 1995, Pages 3764-3767

Raman scattering enhancement by optical confinement in a semiconductor planar microcavity

(3) Fainstein, A a Jusserand, B a Thierry Mieg, V b

a ORANGE LABS (France)

b CNRS (France)

Author keywords

[No Author keywords available]

Indexed keywords

CALCULATIONS; CAVITY RESONATORS; ELECTRIC FIELDS; INTERFACES (MATERIALS); MIRRORS; NUMERICAL METHODS; PHONONS; PHOTONS; SEMICONDUCTING ALUMINUM COMPOUNDS; SEMICONDUCTING GALLIUM ARSENIDE;

ALUMINUM ARSENIDE; DISTRIBUTED BRAGG REFLECTORS; INCIDENCE ANGLE; MATRIX METHOD; SEMICONDUCTOR PLANAR MICROCAVITY; SOLID STATE EXCITATION;

RAMAN SCATTERING;

EID: 0029408619 PISSN: 00319007 EISSN: None Source Type: Journal
DOI: 10.1103/PhysRevLett.75.3764 Document Type: Article

Times cited : (130)

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