High-density data storage using proximal probe techniques

IBM Journal of Research and Development

Volumn 39, Issue 6, 1995, Pages 681-699

  Mamin, H J ^a   Terris, B D ^a   Fan, L S ^a   Hoen, S ^a   Barrett, R C ^a   Rugar, D ^a  

^a NONE

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; SCANNING TUNNELING MICROSCOPY; SEMICONDUCTOR DEVICE STRUCTURES;

DATA RATE; HIGH DENSITY DATA STORAGE; NEAR FIELD OPTICS; PROXIMAL PROBE TECHNIQUES;

DATA STORAGE EQUIPMENT;

EID: 0029407625     PISSN: 00188646     EISSN: None     Source Type: Journal    
DOI: 10.1147/rd.396.0681     Document Type: Article

References (49)